Onyx: Offline SEM-EDS Analysis for Every Pixel

Field notes

The product sits above existing microscope-control and composition-analysis software, taking raw EDS data and applying phase identification, anomaly detection, and cross-dataset comparison. Its stated unit of analysis is notably broad: a complete campaign can include sixteen DOE conditions and hundreds of maps, with results compared across lots and instruments. The searchable library is organized around fields such as alloy, date, instrument, and lot, while JEOL support is listed as planned rather than available.