Observed arrival · 2026-10-10
Optical Metrology Notes
A Chinese-language collection of technical notes on white-light interferometry, semiconductor inspection, thin-film thickness retrieval, and Zemax/Python simulation.
- For
- Optical metrology and semiconductor inspection practitioners
- Worth noticing
- The TSV article labels its values as order-of-magnitude estimates and recommends checking them against a reference method.
Field notes
The listed notes connect measurement theory to practical failure modes. One explains how a fixed-depth peak can point to interference between internal optical surfaces, while the thin-film entry warns that a good fit can still yield a wrong thickness when refractive-index error enters the model. The Zemax entry specifies a collimated source, a glass beam-splitter body, and Detector Viewer output as conditions for seeing the simulated coherent fringes.
Observed signals
Read the marks
Editorial observations of this landing page, not a rating.
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